My mentor is Jennifer Dworak at Brown University. She is an Assistant Professor of Engineering there. She graduated from Texas A&M University under the supervision of Professor M. Ray Mercer. Her research focuses on the correctness and reliability of digital integrated circuits. She works to develop better test pattern generation techniques for improved identification of circuits containing manufacturing defects. Some of the particular topics she has worked on are defect level modeling, delay testing, design verification, and field failure rates due to undetected manufacturing defects or design errors.

Her website can be found here.